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Computed electron micrographs and defect identification.
Material type:
TextSeries: Series defects in crystalline solids, v. <7>Publication details: AmsterdamNew York, N.Y. : NorthHollandAmerican Elsevier, 1973.Description: 400 pISBN: - 0720417570
- 0444104623
| Item type | Home library | Call number | Status | Barcode | |
|---|---|---|---|---|---|
Books
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Centro de Información Eduardo Savino | 537.533.35 H34 (Browse shelf(Opens below)) | Available | 26490 |
Total holds: 0
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