Computed electron micrographs and defect identification.
Head, A. K.
Computed electron micrographs and defect identification. - AmsterdamNew York, N.Y. : NorthHollandAmerican Elsevier, 1973. - 400 p. - Series defects in crystalline solids, v. <7> . - Series defects in crystalline solids, v. <7> .
0720417570 0444104623
Computed electron micrographs and defect identification. - AmsterdamNew York, N.Y. : NorthHollandAmerican Elsevier, 1973. - 400 p. - Series defects in crystalline solids, v. <7> . - Series defects in crystalline solids, v. <7> .
0720417570 0444104623
