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Computed electron micrographs and defect identification.
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TextSeries: Series defects in crystalline solids, v. <7>Publication details: AmsterdamNew York, N.Y. : NorthHollandAmerican Elsevier, 1973.Description: 400 pISBN: - 0720417570
- 0444104623
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Centro de Información Eduardo Savino | 537.533.35 H34 (Browse shelf(Opens below)) | Available | 26490 |
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| 537.533.35 B44 1995 Microbeam and nanobeam analysis. | 537.533.35 G578s Scanning electron microscopy and Xray microanalysis: a text for biologists, materials scientists, and geologists. | 537.533.35 G578 ej.2 Practical scanning electron microscopy: | 537.533.35 H34 Computed electron micrographs and defect identification. | 537.533.35 H351 The use of the scanning electron microscope. | 537.533.35 H351 The use of the scanning electron microscope. | 537.533.35 H615 Electron microscopy of thin crystals. |
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