Electron beam interactions with solids for microscopy, microanalysis and microlithography.

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Material type: Text

TextLanguage: en Publication details: AMF O'Hare, Il. : Scanning electron microscopy, c1984.Description: 372 p. : il. ; 28,5 cmISBN:

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Holdings
Item type	Home library	Call number	Status	Barcode
Books	Centro de Información Eduardo Savino	539.2: 539.12.04 C76 1982 (Browse shelf(Opens below))	Available	34309

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Held at the Asilomar conference center

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