Electron beam interactions with solids for microscopy, microanalysis and microlithography.
Kyser, David F.
Electron beam interactions with solids for microscopy, microanalysis and microlithography. - AMF O'Hare, Il. : Scanning electron microscopy, c1984. - 372 p. : il. ; 28,5 cm.
Held at the Asilomar conference center Bibliografía al final de cada artículo
0931288304
RADIACIONES -EFECTOS EN SOLIDOS -CONGRESOS
MICROSCOPIA ELECTRONICA
539.2:539.12.04"1982" 537.533.35
Electron beam interactions with solids for microscopy, microanalysis and microlithography. - AMF O'Hare, Il. : Scanning electron microscopy, c1984. - 372 p. : il. ; 28,5 cm.
Held at the Asilomar conference center Bibliografía al final de cada artículo
0931288304
RADIACIONES -EFECTOS EN SOLIDOS -CONGRESOS
MICROSCOPIA ELECTRONICA
539.2:539.12.04"1982" 537.533.35