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Integrated circuit failure analysis : a guide to preparation techniques / Friedrich Beck ; translated by Stephen S. Wilson.

By: Material type: TextTextLanguage: English Original language: German Series: Wiley series in quality and reliability engineeringPublication details: Chichester ; New York : Wiley, c1998.Description: xiv, 173 p. : il. ; 24 cmISBN:
  • 0471974013
Uniform titles:
  • Präparationstechniken für die Fehleranalyse an integrierten Halbleiterschaltungen. Inglés
Subject(s): DDC classification:
  • 621.3815 21
Contents:
Purpose and importance of preparatory semiconductor analysis -- Opening the package. Chip insulation -- Wet chemical etching procedures for removing layers of the chip structure -- Crystallographic etching in the silicon -- Dry etching the plasma -- Microsectioning technology, metallography -- Appendix 1: advice on health and safety at work -- Appendix 2: list of manufacturers and suppliers
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Item type Home library Call number Status Barcode
Books Books Centro de Información Eduardo Savino Revistero 621.315.59 B393 (Browse shelf(Opens below)) Available 51390
Total holds: 0

Incluye bibliografía e índice analítico.

Purpose and importance of preparatory semiconductor analysis -- Opening the package. Chip insulation -- Wet chemical etching procedures for removing layers of the chip structure -- Crystallographic etching in the silicon -- Dry etching the plasma -- Microsectioning technology, metallography -- Appendix 1: advice on health and safety at work -- Appendix 2: list of manufacturers and suppliers

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