Scanning electron microscopy and x-ray microanalysis.

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Computer filePublisher: New York, NY : Springer Science+Business Media, LLC, 2018Edition: 4th edDescription: 554 p. ilISBN:

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Item type	Home library	Status	Notes	Barcode
Libro electrónico	Centro de Información Eduardo Savino	Available	Solicitar libro electrónico a bibliotecacies@cnea.gob.ar	51665

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