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Scanning electron microscopy and x-ray microanalysis.

Goldstein, Joseph.

Scanning electron microscopy and x-ray microanalysis. - 4th ed. - 554 p. il.

ISBN: 9781493966745

Subjects--Topical Terms:
ION BEAMS
HACES DE IONES

Subjects--Index Terms: Electron backscatter diffraction Environmental SEM Qualitative X-ray analysis Quantitative X-ray analysis X-ray mapping

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