Characterization in compound semiconductor processing / Yale Strausser and Gary E. McGuire
Material type:
- 9781606500415
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Centro de Información Eduardo Savino Revistero | 621.315.59: 66.017 St912 (Browse shelf(Opens below)) | Available | 51389 |
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620.179.1 M425 Materials characterization using nondestructive evaluation (NDE) methods / | 620.22 C132 The coming of materials science / | 620.3 R433 Resistive switching : | 621.315.59: 66.017 St912 Characterization in compound semiconductor processing / | 621.315.59 B393 Integrated circuit failure analysis : | 621.791.4 M678 Friction stir welding and processing : | 622.775: 510.67 OG34 Heap bioleaching : |
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