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Physical measurements and analysis of thin films: Progress in analytical chemistry.

By:

Murt, E. M [ed]

Contributor(s):

Guldner, W. G [ed]

Material type: Text

Text

TextLanguage: en Series: Simmons, I. L ; | Lublin, P ; | PROGRESS in analytical chemistryPublication details: New York : Plenum Press, 1969.

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Item type	Home library	Call number	Copy number	Status	Barcode
Books	Centro de Información Eduardo Savino	539.23 M (Browse shelf(Opens below))	V.2	Available	349 PMM

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