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Practical scanning electron microscopy: electron and ion microprobe analysis.
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TextLanguage: en Publication details: New York and London : Plenum press, 1977.Edition: 3a edDescription: xxiii, 582 p. : il., graf., fotISBN: - 0306308207
| Item type | Home library | Call number | Copy number | Status | Barcode | |
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Centro de Información Eduardo Savino | 537.533.35 G578 (Browse shelf(Opens below)) | Available | 27739 | ||
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Books
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Centro de Información Eduardo Savino | 537.533.35 G578 ej.2 (Browse shelf(Opens below)) | 2 | Available | 28406 |
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| 537.533.35 [076.6] L989 Scanning electron microscopy, Xray microanalysis, and analytical electron microscopy: a laboratory workbook. | 537.533.35 B44 1995 Microbeam and nanobeam analysis. | 537.533.35 G578s Scanning electron microscopy and Xray microanalysis: a text for biologists, materials scientists, and geologists. | 537.533.35 G578 ej.2 Practical scanning electron microscopy: | 537.533.35 H34 Computed electron micrographs and defect identification. | 537.533.35 H351 The use of the scanning electron microscope. | 537.533.35 H351 The use of the scanning electron microscope. |
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