Electron beam interactions with solids for microscopy, microanalysis and microlithography.

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TextLanguage: en Publication details: AMF O'Hare, Il. : Scanning electron microscopy, c1984.Description: 372 p. : il. ; 28,5 cmISBN:

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Item type	Home library	Call number	Status	Barcode
Books	Centro de Información Eduardo Savino	539.2: 539.12.04 C76 1982 (Browse shelf(Opens below))	Available	34309

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Previous	539.2: 539.1.04 G562 1967 Proceedings of ....	539.2: 539.12.04 Am35 So13 1959 ej.2 Materials in nuclear applications.	539.2: 539.12.04 B496 Radiation damage in solids.	539.2: 539.12.04 C76 1982 Electron beam interactions with solids for microscopy, microanalysis and microlithography.	539.2: 539.12.04 Ch344 Radiation damage in crystals.	539.2: 539.12.04 D565 Radiation effects in solids.	539.2: 539.12.04 D565 Radiation effects in solids.	Next

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