Thin film materials : stress, defect formation and surface evolution.

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Material type: Text

TextLanguage: en Publication details: New York : Cambridge University press, 2003.Description: xviii, 750 p. : il., tabla, diagrISBN:

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Holdings
Item type	Home library	Call number	Status	Barcode
Books	Centro de Información Eduardo Savino	539.23 F896 (Browse shelf(Opens below))	Missing	50899

Total holds: 0

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Bibliografía: p.713-737

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