000 01383cam a22003251 4500
001 2643035
005 20250730092105.0
008 740813s1967 us ad frb 101 0 eng
010 _a 66062907
035 _a2643035
040 _aDLC
_cAR-SmCIES
111 2 _aMaterials Research Symposium
_n(1st :
_d1966 :
_cGaithersburg, Md.)
_910749
245 1 0 _aTrace characterization. Chemical and physical.
260 _aWashington:
_bDept. of Commerce (National Bureau of Standards),
_c1967
300 _axviii, 580 p.
_bilustraciones; gráficos; tablas;
490 1 _aNational Bureau of Standards Monograph
_xN°100
500 _aBased on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966.
504 _aIncludes bibliographies.
650 0 _aQUÍMICA
_2INIST
_9263
650 0 _aFÍSICA QUÍMICA
_2INIST
_9883
650 0 _aTÉCNICAS DE TRAZADORES
_2INIST
_910750
650 0 _aELECTROQUÍMICA
_2INIST
_9892
650 0 _aESPECTROSCOPÍA
_2INIST
_93095
655 7 _aConference papers and proceedings.
_2lcgft
_0https://id.loc.gov/authorities/genreForms/gf2014026068
_93106
700 1 _aMeinke, W. Wayne,
_eed.
_910751
700 1 _aScribner, Bourdon Francis,
_eed.
_910752
710 2 _aInstitute for Materials Research (U.S.A.)
_910753
830 0 _aNBS Monograph ;
_v100.
_910754
942 _2udc
_cBK
_n0
999 _c34974
_d34973