000 01246cam a2200385 a 4500
001 11769906
003 AR-SmCIES
005 20250704160541.0
008 990810s2000 nyua b 001 0 eng
010 _a 99044927
020 _a047135418X
_qcl. : alk. paper
035 _a11769906
035 _a(DLC) 99044927
040 _aDLC
_cAR-SmCIES
_dDLC
042 _apcc
050 0 0 _aQA76.76.T48
_bP46 2000
082 0 0 _a005.1/4
_221
100 1 _aPerry, William E
_910651
245 1 0 _aEffective methods for software testing
250 _a2a. ed.
260 _aNew York :
_bWiley,
_c2000.
300 _axx, 812 p.:
_bil., graf.;
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
650 0 _aCOMPUTER SOFTWARE
_910652
650 0 _aDATA PROCESSING
_xINIST
_910653
653 _aSOFTWARE
653 _aDATA DISPLAY SYSTEMS
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/bios/wiley047/99044927.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley031/99044927.html
856 4 _3Table of Contents
_uhttp://www.loc.gov/catdir/toc/onix01/99044927.html
942 _2udc
_cBK
_n0
999 _c34938
_d34937