000 01190nam a22003251 4500
999 _c34536
_d34535
001 2172834
003 AR-SmCIES
005 20241114095037.0
008 831208s1966 fr ad frb 101 0 fre
010 _a 67069571
015 _aF67-7818
020 _c180F
040 _aDLC/ICU
111 2 _aInternational Symposium on X-ray Optics and X-ray Microanalysis
_n(4th :
_d1965 :
_cOrsay, France)
_99501
245 1 0 _aOptique des rayons X et microanalyse,
_bX-ray optics and microanalysis, IVe Congrès international sur l'optique des rayons X et la microanalyse, Orsay, [7-10] septembre 1965.
260 _aParis,
_bHermann,
_c1966.
300 _a706 p.
_bilustraciones; gráficos; tablas
500 _aFrench, English, or German.
504 _aIncludes bibliographies.
650 0 _aÓPTICA
_2SPINEST
_92363
650 0 _aRAYOS X
_2SPINEST
_94536
650 0 _aANÁLISIS DE RAYOS X
_2SPINEST
_99502
650 0 _aSONDAS
_2INIST
_99496
650 0 _aEQUIPO ELECTRÓNICO
_2INIST
_99503
700 1 _aCastaing, Raymond
_eed.
_99504
700 1 _aDeschamps, Paul
_eed.
_99505
700 1 _aPhilibert, Jean
_eed.
_99506
740 0 _aX-ray optics and microanalysis.
942 _2udc
_cBK