000 01331cam a22003491 4500
999 _c34156
_d34155
001 8438664
003 AR-SmCIES
005 20240711111416.0
008 740716e1962 paua frb 101 0 eng
010 _a 62009417
035 _a(OCoLC)946573
040 _aDLC
_cAR-SmCIES
042 _apremarc
110 _aAmerican Society for Testing and Materials [ASTM]
_98184
111 1 0 _aSymposium on Extension of Sensitivity for Determining Various Constituents in Metals
_c(Atlantic City:
_dJune 28, 1961)
_98185
245 0 0 _aSymposium on Extension of Sensitivity for Determining Various Constituents in Metals
260 _aPhiladelphia:
_bAmerican Society for Testing and Materials,
_c1962
300 _a68 p.
_bilustraciones; figuras; diagramas;
490 1 _aASTM Special Technical Publication
_vN°308
504 _aIncludes bibliographies.
650 0 _aCIENCIA
_2UNBIST
_9361
650 0 _aMATERIALES
_2UNBIST
_98174
650 0 _aANÁLISIS QU� MICO
_2UNBIST
_92301
650 0 _aMETALES
_2UNBIST
_91306
653 _aTESTEO DE METALES
653 _aANÁLISIS DE METALES
710 2 _aASTM Committee E-2: Emission Spectroscopy.
_98178
710 2 _aASTM Committee E-3: Chemical Analysis of Metals.
_98179
810 2 _aASTM
_tSpecial technical publication
_vN°308
_98180
906 _cl
942 _2udc
_cBK