000 01017cam a2200265 i 4500
999 _c33178
_d33178
001 3166290
003 AR-SmCIES
005 20230307112213.0
008 750514s1974 enka b 101 0 eng
015 _aGB 75-02825
020 _a0904357015 :
_c£3.60
040 _cAR-SmCIES
082 _a539.24: 621.9.048.7 M2 SR171
245 0 0 _aAdvances in analysis of microstructural features by electron-beam techniques :
_bproceedings of a two-day meeting jointly organized by the Metals Society and the Institute of Physics held at the Royal Society, London, on 14-15 May 1974.
260 _aLondon :
_bMetals Society,
_c1974.
300 _a[5], 260 p. :
_bil. ;
_c25 cm.
504 _aIncluye bibliografía e índice.
650 0 _aElectron metallography
_xCongresses.
_94578
650 0 _aHACES DE ELECTRONES
_94579
650 0 _aMICROANALISIS
_94580
650 0 _aESPECTROSCOPIA ELECTRÓNICA
_94581
710 2 _aMetals Society.
_94582
710 2 _aInstitute of Physics (Great Britain)
_94583
942 _2ddc
_cBK