000 | 01017cam a2200265 i 4500 | ||
---|---|---|---|
999 |
_c33178 _d33178 |
||
001 | 3166290 | ||
003 | AR-SmCIES | ||
005 | 20230307112213.0 | ||
008 | 750514s1974 enka b 101 0 eng | ||
015 | _aGB 75-02825 | ||
020 |
_a0904357015 : _c£3.60 |
||
040 | _cAR-SmCIES | ||
082 | _a539.24: 621.9.048.7 M2 SR171 | ||
245 | 0 | 0 |
_aAdvances in analysis of microstructural features by electron-beam techniques : _bproceedings of a two-day meeting jointly organized by the Metals Society and the Institute of Physics held at the Royal Society, London, on 14-15 May 1974. |
260 |
_aLondon : _bMetals Society, _c1974. |
||
300 |
_a[5], 260 p. : _bil. ; _c25 cm. |
||
504 | _aIncluye bibliografía e índice. | ||
650 | 0 |
_aElectron metallography _xCongresses. _94578 |
|
650 | 0 |
_aHACES DE ELECTRONES _94579 |
|
650 | 0 |
_aMICROANALISIS _94580 |
|
650 | 0 |
_aESPECTROSCOPIA ELECTRÓNICA _94581 |
|
710 | 2 |
_aMetals Society. _94582 |
|
710 | 2 |
_aInstitute of Physics (Great Britain) _94583 |
|
942 |
_2ddc _cBK |