000 00970nam a22002897a 4500
999 _c33122
_d33122
003 AR-SmCIES
005 20221104152823.0
008 221104t1975 engdoa||r|||| 00| 0 eng d
020 _a0412137607
040 _cAR-SmCIES
100 1 0 _aLoretto, M. H.
_94369
245 1 0 _aDefect analysis in elctron microscopy
260 _aLondres:
_bChapman and Hall,
_c1975.
300 _aix, 134 p.:
_bgraf., il., fot.;
650 7 _2INIST
_93457
_aMICROSCOPIA ELECTRONICA
650 7 _2INIST
_93456
_aELECTRON MICROSCOPY
650 7 _2INIST
_961
_aDEFECTOS
650 7 _2INIST
_94354
_aDIFRACCION ELECTRONICA
650 7 _2INIST
_91166
_aDEFECTOS CRISTALINOS
650 7 _2INIST
_aTRANSMISSION ELECTRON MICROSCOPY
_94370
650 7 _2INIST
_aMICROSCOPIA ELECTRONICA POR TRANSMISION
_94371
650 7 _2INIST
_93980
_aDISLOCATIONS
650 7 _2INIST
_93946
_aKIKUCHI LINES
650 7 _2INIST
_aLINEAS DE KIKUCHI
_94372
700 _aSmallman, R. E.
_94373
942 _2udc
_cBK