000 | 00970nam a22002897a 4500 | ||
---|---|---|---|
999 |
_c33122 _d33122 |
||
003 | AR-SmCIES | ||
005 | 20221104152823.0 | ||
008 | 221104t1975 engdoa||r|||| 00| 0 eng d | ||
020 | _a0412137607 | ||
040 | _cAR-SmCIES | ||
100 | 1 | 0 |
_aLoretto, M. H. _94369 |
245 | 1 | 0 | _aDefect analysis in elctron microscopy |
260 |
_aLondres: _bChapman and Hall, _c1975. |
||
300 |
_aix, 134 p.: _bgraf., il., fot.; |
||
650 | 7 |
_2INIST _93457 _aMICROSCOPIA ELECTRONICA |
|
650 | 7 |
_2INIST _93456 _aELECTRON MICROSCOPY |
|
650 | 7 |
_2INIST _961 _aDEFECTOS |
|
650 | 7 |
_2INIST _94354 _aDIFRACCION ELECTRONICA |
|
650 | 7 |
_2INIST _91166 _aDEFECTOS CRISTALINOS |
|
650 | 7 |
_2INIST _aTRANSMISSION ELECTRON MICROSCOPY _94370 |
|
650 | 7 |
_2INIST _aMICROSCOPIA ELECTRONICA POR TRANSMISION _94371 |
|
650 | 7 |
_2INIST _93980 _aDISLOCATIONS |
|
650 | 7 |
_2INIST _93946 _aKIKUCHI LINES |
|
650 | 7 |
_2INIST _aLINEAS DE KIKUCHI _94372 |
|
700 |
_aSmallman, R. E. _94373 |
||
942 |
_2udc _cBK |