000			00970nam a22002897a 4500
999			_c33122 _d33122
003			AR-SmCIES
005			20221104152823.0
008			221104t1975 engdoa||r|||| 00| 0 eng d
020			_a0412137607
040			_cAR-SmCIES
100	1	0	_aLoretto, M. H. _94369
245	1	0	_aDefect analysis in elctron microscopy
260			_aLondres: _bChapman and Hall, _c1975.
300			_aix, 134 p.: _bgraf., il., fot.;
650		7	_2INIST _93457 _aMICROSCOPIA ELECTRONICA
650		7	_2INIST _93456 _aELECTRON MICROSCOPY
650		7	_2INIST _961 _aDEFECTOS
650		7	_2INIST _94354 _aDIFRACCION ELECTRONICA
650		7	_2INIST _91166 _aDEFECTOS CRISTALINOS
650		7	_2INIST _aTRANSMISSION ELECTRON MICROSCOPY _94370
650		7	_2INIST _aMICROSCOPIA ELECTRONICA POR TRANSMISION _94371
650		7	_2INIST _93980 _aDISLOCATIONS
650		7	_2INIST _93946 _aKIKUCHI LINES
650		7	_2INIST _aLINEAS DE KIKUCHI _94372
700			_aSmallman, R. E. _94373
942			_2udc _cBK