000			01055nam a22003017a 4500
999			_c33118 _d33118
003			AR-SmCIES
005			20221028160319.0
008			221028t19781970engod|||r|||| 00| 0 eng d
020			_a0444851291
040			_cAR-SmCIES
245			_aDiffraction and imaginig techniques in material science
250			_a2a ed _brev.
260			_aAmsterdam: _bNorth-Holland, _c1978.
300			_avol II, ix, 457-847 p.: _bfot., graf.;
650		7	_2INIST _93457 _aMICROSCOPIA ELECTRONICA
650		7	_2INIST _93456 _aELECTRON MICROSCOPY
650		7	_2INIST _aLOW ENERGY ELECTRON DIFFRACTION _94360
650		7	_2INIST _aDIFRACCION DE ELECTRONES DE BAJA ENERGIA _94361
650		7	_2INIST _974 _aDIFRACCION DE RAYOS X
650		7	_2INIST _92904 _aX-RAY DIFFRACTION
650		7	_2INIST _aFIELD EMISSION MICROSCOPY _94362
650		7	_2INIST _aMICROSCOPIA DE EMISION DE CAMPO _94363
653			_aMIRROR ELECTRON MICROSCOPY
700			_94357 _aAmelinckx, S. _eEd.
700			_94358 _aGevers, R. _eEd.
700			_94359 _aVan Landuyt, J. _eEd.
942			_2udc _cBK