| 000 | 00951nam a22002897a 4500 | ||
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| 999 |
_c33117 _d33117 |
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| 003 | AR-SmCIES | ||
| 005 | 20221028151201.0 | ||
| 008 | 221028t19781970ne oa|||r|||| 00| 0 eng d | ||
| 020 | _a0444851283 | ||
| 040 | _cAR-SmCIES | ||
| 245 | 1 | 0 | _aDiffraction and imaging techniques in material science |
| 250 |
_a2a ed. _brev. |
||
| 260 |
_aAmsterdam: _bNorth-Holland, _c1978. |
||
| 300 |
_avol I, ix, 453 p.: _bgraf., fot.; |
||
| 650 | 7 |
_2INIST _92377 _aDIFFRACTION |
|
| 650 | 7 |
_2INIST _93456 _aELECTRON MICROSCOPY |
|
| 650 | 7 |
_2INIST _93457 _aMICROSCOPIA ELECTRONICA |
|
| 650 | 7 |
_2INIST _aELECTRON DIFFRACTION _94353 |
|
| 650 | 7 |
_2INIST _aDIFRACCION ELECTRONICA _94354 |
|
| 650 | 7 |
_2INIST _aATOMIC CLUSTERS _94355 |
|
| 650 | 7 |
_2INIST _aAGRUPACIONES ATOMICAS _94356 |
|
| 650 | 7 |
_2INIST _92904 _aX-RAY DIFFRACTION |
|
| 700 |
_aAmelinckx, S. _eEd. _94357 |
||
| 700 |
_aGevers, R. _eEd. _94358 |
||
| 700 |
_aVan Landuyt, J. _eEd. _94359 |
||
| 942 |
_2udc _cBK |
||