| 000 | 01055nmm a22003375i 4500 | ||
|---|---|---|---|
| 999 |
_c32982 _d32982 |
||
| 001 | 19655760 | ||
| 003 | AR-SmCIES | ||
| 005 | 20220804101022.0 | ||
| 008 | 170522s2018 nyu 000 0 eng | ||
| 020 | _a9781493966745 | ||
| 042 | _apcc | ||
| 100 | 1 |
_aGoldstein, Joseph. _93650 |
|
| 245 | 1 | 0 | _aScanning electron microscopy and x-ray microanalysis. |
| 250 | _a4th ed. | ||
| 264 | 1 |
_aNew York, NY : _bSpringer Science+Business Media, LLC, _c2018. |
|
| 300 |
_a554 p. _bil. |
||
| 650 | 7 |
_2inist _aION BEAMS _93656 |
|
| 650 | 7 |
_2inist _aHACES DE IONES _93657 |
|
| 653 | _aElectron backscatter diffraction | ||
| 653 | _aEnvironmental SEM | ||
| 653 | _aQualitative X-ray analysis | ||
| 653 | _aQuantitative X-ray analysis | ||
| 653 | _aX-ray mapping | ||
| 700 | 1 |
_aNewbury, Dale E. _93651 |
|
| 700 | 1 |
_aMichael, Joseph R. _93652 |
|
| 700 | 1 |
_aRitchie, Nicholas W.M. _93653 |
|
| 700 | 1 |
_aScott, John Henry J. _93654 |
|
| 700 | 1 |
_aJoy, David C. _93655 |
|
| 856 | _ySolicitar libro electrónico a bibliotecacies@cnea.gob.ar | ||
| 942 |
_2udc _cEB |
||