| 000 | 00811cam a22002171 4500 | ||
|---|---|---|---|
| 999 |
_c32879 _d32879 |
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| 001 | 11163213 | ||
| 003 | AR-SmCIES | ||
| 005 | 20191227120705.0 | ||
| 008 | 751101s19641982njuar 1 a1eng d | ||
| 022 |
_a0146-8057 _l0146-8057 _21 |
||
| 080 | _a539.124 | ||
| 111 | 2 |
_aInternational Conference on Electron and Ion Beam Science and Technology. _cNew York) _d1970 : _e(4th : _93315 |
|
| 245 | 1 | 0 |
_aElectron and ion beam science and technology; _bFourth international conference. |
| 260 |
_aPrinceton, N.J. _bElectrochemical Society, _c1970. |
||
| 300 |
_a666 p. _bil.; _c24 cm |
||
| 650 | 7 |
_aELECTRON BEAMS _2inist _93316 |
|
| 650 | 7 |
_aHACES ELECTRONICOS _2inist _93317 |
|
| 700 | 1 |
_aBakish, Robert A. _93318 |
|
| 710 | 2 |
_aElectrochemical Society. _bElectrothermics and Metallurgy Division. _93319 |
|
| 942 |
_2udc _cBK |
||