000 01088cam a22002891 4500
999 _c32788
_d32788
001 8385981
003 AR-SmCIES
005 20230302154325.0
008 770609s1953 nyuad r 000 0 eng d
010 _a 54000947
035 _a(OCoLC)3027349
040 _aDLC
_cGAT
_dOCoLC
_dDLC
042 _apremarc
050 0 0 _aTA406.5
_b.A47 1952
110 2 _aAmerican Society for Testing Materials.
_92969
245 1 0 _aSymposium on light microscopy;
_bpresented at the fifty-fifth annual meeting (fiftieth anniversary meeting) American Society for Testing Materials, New York, N. Y., June 25, 1952.
260 _aPhiladelphia :
_c[1953]
300 _a126 p.
_bil.
_c23 cm.
490 1 _aIts Special technical publication
_vno. 143
500 _a"Committee E-1 on Methods of Testing sponsored the symposium."
504 _abibliografía al final del volúmen.
650 0 _aMicroscopy.
_92970
650 0 _aMICROSCOP� A
_92971
740 0 _aLight microscopy.
810 2 _aAmerican Society for Testing Materials.
_tSpecial technical publication
_vno. 143.
_92972
942 _2ddc
_cBK