| 000 | 00536nam a2200181u 4500 | ||
|---|---|---|---|
| 999 |
_c32775 _d32775 |
||
| 001 | 9571502 | ||
| 003 | AR-SmCIES | ||
| 005 | 20190830104553.0 | ||
| 008 | 841120s1948 enka r 001 0 eng d | ||
| 040 |
_aDLC _cCarP _dDLC |
||
| 080 | _a535.417 | ||
| 100 | 1 |
_aTolansky, Samuel. [from old catalog] _92936 |
|
| 245 | 0 | 0 | _aMultiple-beam interferometry of surfaces and films. |
| 260 |
_aOxford : _bClarendon Press, _c1948. |
||
| 300 |
_aviii, 187 p. _c23 cm. |
||
| 504 | _aíndice y bibliografía al final del volúmen. | ||
| 942 |
_2ddc _cBK |
||