| 000 | nam a22 7a 4500 | ||
|---|---|---|---|
| 999 |
_c26446 _d26446 |
||
| 003 | AR-SmCIES | ||
| 005 | 20180409145606.0 | ||
| 008 | 180409b xxu||||| |||| 001 0 eng d | ||
| 020 | _a9781606500415 | ||
| 100 |
_aStrausser, Yale _eed. _936 |
||
| 245 |
_aCharacterization in compound semiconductor processing / _cYale Strausser and Gary E. McGuire |
||
| 260 | 3 |
_aNew York : _bMomentum Press, _c2010 |
|
| 300 | _a199 p. | ||
| 440 |
_aMaterial characterization series _937 |
||
| 942 |
_2udc _cBK |
||