| 000 | 01046nam a2200313 a 4500 | ||
|---|---|---|---|
| 003 | AR-SmCIES | ||
| 005 | 20250715134910.0 | ||
| 008 | 170703s1964#### ukad||f#|||||00| 0#eng#d | ||
| 040 | _cAR-SmCIES | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a42106 | ||
| 100 | 1 |
_aCali, J. Paul _eed _910704 |
|
| 245 | 1 | 0 | _aTrace analysis of semiconductor materials. |
| 260 |
_aOxford : _bPergamon press, _c1964. |
||
| 300 |
_aix, 282 p. : _btablas, diagrs. |
||
| 490 | 1 | _aInternational series of monographs in analytical chemistry, v.<11> | |
| 500 | _aBibliografía al final de cada capítulo | ||
| 650 | 4 |
_aMATERIALES _2INIST |
|
| 650 | 4 |
_aMATERIALES SEMICONDUCTORES _2INIST _910705 |
|
| 650 | 4 |
_aCONDUCTORES ELÉCTRICOS _2INIST _92125 |
|
| 650 | 4 |
_aESPECTROSCOPÍA _2INIST _93095 |
|
| 650 | 4 |
_aFLUORESCENCIA _2INIST _92815 |
|
| 800 | 1 |
_aBelcher, R. _eed _910706 |
|
| 800 | 1 |
_aGordon, L. _eed _910707 |
|
| 830 |
_aInternational series of monographs in analytical chemistry, v.<11> _910708 |
||
| 942 |
_2udc _cBK |
||
| 999 |
_c26249 _d26249 |
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