000 | 00826nam a2200229 a 4500 | ||
---|---|---|---|
008 | 170703s1993#### ukd|||f#|||||10| 0#eng#d | ||
003 | AR-SmCIES | ||
041 | 7 |
_aen _2ISO 639-1 |
|
091 | _a51236 | ||
100 | 1 | _aSenoussi, S. | |
245 | 1 | 0 | _aWhy the critical current densities of high-Tc's vary anomalously with temperature, field and time. |
260 |
_aSouth Yorkshire : _bSheffield Hallam University, _c1993. |
||
300 |
_a56 p. : _bdiagr. |
||
500 | _aBibliografĂa: p.55-56 | ||
650 | 4 | _aMICROSCOPIA ELECTRICA -METALOGRAFIA | |
700 | 1 | _aAguillon-Levillain C. | |
700 | 1 | _aMosbah, M | |
700 | 1 | _aRégnier, P. | |
711 | 2 |
_aInternational workshop on electronic properties of metal/non metal microsystems _n4 _d1993 |
|
999 |
_c26244 _d26244 |