| 000 | 01588nam a2200349 a 4500 | ||
|---|---|---|---|
| 008 | 170703t1996####ii ad||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 020 | _a8120411234 | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a51077 | ||
| 092 | _av.1 [p.ixxxiii, 1314, I18] | ||
| 111 | 2 |
_aTrends in NDE <Non Destructive examination> Science and Technology _cNew Delhi,IN _d1996 |
|
| 245 | 1 | 0 | _aWorld Conference on Non Destructive Testing <WCNDT>. |
| 260 |
_aNew Delhi : _bOxford and IBH publishing, _cc1996. |
||
| 300 |
_a v. : _bil., tabla, diagr. |
||
| 500 | _aBibliografía al final de cada artículo | ||
| 650 | 4 | _aENSAYOS NO DESTRUCTIVOS | |
| 711 | 2 |
_aProceedings of the world Conference on NDT _n14 _cNew Delhi,IN _d1996 |
|
| 800 | 1 |
_aKrishnadas, Nair _eed. |
|
| 800 | 1 |
_aBaldev, Raj _eed. |
|
| 800 | 1 |
_aMurthy, C.R.L. _eed. |
|
| 800 | 1 |
_aJayamukar, T. _eed. |
|
| 999 |
_c25998 _d25998 |
||