| 000 | 00808nam a2200217 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1963####nyu||||f#|||||10| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a11293 | ||
| 100 | 1 | _aThomas, Gareth | |
| 245 | 1 | 0 | _aElectron microscopy and strength of crystals. |
| 260 |
_aNew York : _bInterscience publ., _c1963. |
||
| 300 | _a[xi] 1022 p. | ||
| 500 | _aBibliografía y discusiones al final de cada artículo | ||
| 650 | 4 | _aMICROSCOPIOS ELECTRONICOS -CONGRESOS | |
| 700 | 1 | _aWashburn, Jack | |
| 711 | 2 |
_aInternational materials conference _cBerkeley, Calif.,US _d1961 |
|
| 999 |
_c24639 _d24639 |
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