000 00778nam a2200241 a 4500
008 170703s1984####si ad||f#|||||10| 0#eng#d
003 AR-SmCIES
020 _a9971966468
020 _a997196645X
041 7 _aen
_2ISO 639-1
041 7 _aen
_2ISO 639-1
091 _a49304
100 1 _aHewitt, Paul L.
_eed.
245 1 0 _aModern techniques in metrology.
260 _aSingapore :
_bWorld Scientific,
_c1984.
300 _aviii, 347 p. :
_btabla, diagr.
500 _aBibliografĂ­a al final de cada artĂ­culo
650 4 _aMEDICION -CONGRESOS
650 4 _aMETROLOGIA -CONGRESOS
711 2 _aRegional workshop on metrology for developing countries
_cSidney,AU
_d1982
999 _c24431
_d24431