000 00594nam a2200181 a 4500
008 170703s2000####au ad||f#|||||00| 0#eng#d
003 AR-SmCIES
022 _a1011-4289
024 8 _aIAEA-TECDOC-1190
041 7 _aen
_2ISO 639-1
091 _a49002
245 1 0 _aInstrumentation for PIXE [Particle Induced X ray Emission] and RBS [Rutherford Backscattering Spectometry].
260 _aVienna :
_bIAEA,
_c2000.
300 _a71 p. :
_btabla, diagr.
500 _aBibliografía: p.65-70
999 _c24104
_d24104