| 000 | 00794nam a2200253 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1995####nyuad||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 020 | _a0387945415 | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a31 4 5 285 ITJS | ||
| 100 | 1 | _aZevin, Lev S. | |
| 245 | 1 | 0 | _aQuantitative Xray diffractometry. |
| 260 |
_aNew York : _bSpringer, _c1995. |
||
| 300 |
_axvii, 372 p. : _btabla, diagr. |
||
| 500 | _aBibliografía: p.355-364 | ||
| 650 | 4 | _aDIFRACCION DE RAYOS X | |
| 650 | 4 | _aDIFRACCION DE RAYOS X -APLICACIONES INDUSTRIALES | |
| 650 | 4 | _aRAYOS X -ANALISIS | |
| 650 | 4 | _aANALISIS CUANTITATIVO | |
| 700 | 1 | _aKimmel, Giora | |
| 700 | 1 |
_aMureinik, Inez _eed. |
|
| 999 |
_c23652 _d23652 |
||