000 01073nam a2200301 a 4500
008 170703s1996####au ad||f#|||||00| 0#eng#d
003 AR-SmCIES
020 _a3211828745
022 _a00263672
041 7 _aen
_2ISO 639-1
041 7 _aen
_2ISO 639-1
091 _a31 4 5 241 ITJS
100 1 _aBenoit, Daniele
_eed.
245 1 0 _aMicrobeam and nanobeam analysis.
260 _aWien, New York :
_bSpringer,
_c1996.
300 _axi, 643 p. :
_bil., tabla, diagr.
500 _a"Mikrochimica Acta, Supplement 13"
500 _aBibliografĂ­a al final de cada artĂ­culo
650 4 _aMICROSCOPIA ELECTRONICA -CONGRESOS
650 4 _aMETALES -MICROANALISIS -CONGRESOS
700 1 _aBresse, Jean Francois
_eed.
700 1 _aVan't dack, Luc
_eed.
700 1 _aWerner, Helmut
_eed.
700 1 _aWernisch, Johann
_eed.
711 2 _aWorkshop on modern developments and applications in microbeam analysis
_n4
_cSaint Malo,FR
_d1995
999 _c23594
_d23594