000 | 01442nam a2200361 a 4500 | ||
---|---|---|---|
008 | 170703s1990####nyuad||f#|||||00| 0#eng#d | ||
003 | AR-SmCIES | ||
020 | _a0306435918 | ||
041 | 7 |
_aen _2ISO 639-1 |
|
091 | _a48499 | ||
100 | 1 | _aLyman, Charles E. | |
245 | 1 | 0 | _aScanning electron microscopy, Xray microanalysis, and analytical electron microscopy: a laboratory workbook. |
260 |
_aNew York and London : _bPlenum press, _c1990. |
||
300 |
_axi, 407 p. : _bil., tabla, diagr. |
||
500 | _aBibliografía al final de algunos capítulos | ||
650 | 4 | _aMICROSCOPIA ELECTRONICA -ENSEÑANZA PROGRAMADA | |
650 | 4 | _aMICROSCOPIA ELECTRONICA POR BARRIDO -ENSEÑANZA PROGRAMADA | |
650 | 4 | _aMICROANALISIS POR RAYOS X -ENSEÑANZA PROGRAMADA | |
700 | 1 | _aGoldstein, Joseph I. | |
700 | 1 | _aRomig, Alton D. | |
700 | 1 | _aEchlin, Patrick | |
700 | 1 | _aJoy, David C. | |
700 | 1 | _aNewbury, Dale E. | |
700 | 1 | _aWilliams, David B. | |
700 | 1 | _aArmstrong, John T. | |
700 | 1 | _aFiori, Charles E. | |
700 | 1 | _aLifshin, Eric | |
700 | 1 | _aPeters, Klaus Ruediger | |
999 |
_c23473 _d23473 |