| 000 | 00851nam a2200265 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1995####nyuad||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 020 | _a0824795547 | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a48320 | ||
| 100 | 1 | _aJenkins, Ronald | |
| 245 | 1 | 0 | _aQuantitative Xray spectrometry. |
| 260 |
_aNew York : _bMarcel Dekker, _c1995. |
||
| 300 |
_axi, 484 p. : _bil., tabla, diagr. |
||
| 490 | 1 | _aPractical spectroscopy series, v.<20> | |
| 500 | _aApéndices: p.461-477 | ||
| 500 | _aBibliografía al final de cada capítulo | ||
| 650 | 4 | _aRAYOS X -ANALISIS | |
| 650 | 4 | _aESPECTROS DE RAYOS X | |
| 700 | 1 | _aGould, Robert William | |
| 700 | 1 | _aGedcke, Dale | |
| 830 | _aPractical spectroscopy series, v.<20> | ||
| 999 |
_c23302 _d23302 |
||