000 01231nam a2200313 a 4500
008 170703s1995####xxua|||f#|||||00| 0#eng#d
003 AR-SmCIES
020 _a0819416833
041 7 _aen
_2ISO 639-1
041 7 _aen
_2ISO 639-1
091 _a31 4 5 155 ITJS
100 1 _aHarding, Kevin G.
_eed.
245 1 0 _aIndustrial optical sensors for metrology and inspection.
260 _aBellingham, Wash. :
_bSPIEThe International Society for Optical Engineering,
_c1995.
300 _aix, 272 p. :
_bil.
490 1 _aProceedings series, v.<2349>
500 _aBibliografĂ­a al final de cada artĂ­culo
650 4 _aOPTICA -INSTRUMENTOS -CONGRESOS
650 4 _aTRANSDUCTORES Y SENSORES -CONGRESOS
650 4 _aLASERS -CONGRESOS
650 4 _aINTERFEROMETROS -CONGRESOS
650 4 _aMEDICION INSTRUMENTOS -CONGRESOS
700 1 _aStahl, H. Philip
_eed.
711 2 _aConference on industrial optical sensors for metrology and inspection
_cBoston, Mass.,US
_d1994
810 2 _aSociety of photooptical instrumentation engineers, Bellingham, Wash.
830 _aProceedings series, v.<2349>
999 _c23254
_d23254