000 | 01231nam a2200313 a 4500 | ||
---|---|---|---|
008 | 170703s1995####xxua|||f#|||||00| 0#eng#d | ||
003 | AR-SmCIES | ||
020 | _a0819416833 | ||
041 | 7 |
_aen _2ISO 639-1 |
|
041 | 7 |
_aen _2ISO 639-1 |
|
091 | _a31 4 5 155 ITJS | ||
100 | 1 |
_aHarding, Kevin G. _eed. |
|
245 | 1 | 0 | _aIndustrial optical sensors for metrology and inspection. |
260 |
_aBellingham, Wash. : _bSPIEThe International Society for Optical Engineering, _c1995. |
||
300 |
_aix, 272 p. : _bil. |
||
490 | 1 | _aProceedings series, v.<2349> | |
500 | _aBibliografĂa al final de cada artĂculo | ||
650 | 4 | _aOPTICA -INSTRUMENTOS -CONGRESOS | |
650 | 4 | _aTRANSDUCTORES Y SENSORES -CONGRESOS | |
650 | 4 | _aLASERS -CONGRESOS | |
650 | 4 | _aINTERFEROMETROS -CONGRESOS | |
650 | 4 | _aMEDICION INSTRUMENTOS -CONGRESOS | |
700 | 1 |
_aStahl, H. Philip _eed. |
|
711 | 2 |
_aConference on industrial optical sensors for metrology and inspection _cBoston, Mass.,US _d1994 |
|
810 | 2 | _aSociety of photooptical instrumentation engineers, Bellingham, Wash. | |
830 | _aProceedings series, v.<2349> | ||
999 |
_c23254 _d23254 |