000 00662nam a2200217 a 4500
008 170703s1969####gw ||||f#|||||10| 0#eng#d
003 AR-SmCIES
041 7 _aen
_2ISO 639-1
080 _a537.531
091 _a281 PMM
100 1 _aMöllenstedt, G.
_eed
245 1 0 _aProceedings.
260 _aBerlin :
_bSpringer-Verlag,
_c1969.
300 _axii, 612 p.
500 _aPortada en ingles, aleman y frances
650 4 _aRAYOS X
700 1 _aGaukler, K.H.
_eed
711 2 _aInternational congress on x-ray optics and microanalysis
_n5
_cTübingen,DE
_d1968
999 _c23039
_d23039