| 000 | 00763nam a2200241 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1973####ne ||||f#|||||00| 0#uuu#d | ||
| 003 | AR-SmCIES | ||
| 020 | _a0720417570 | ||
| 020 | _a0444104623 | ||
| 091 | _a26490 | ||
| 100 | 1 | _aHead, A. K. | |
| 245 | 1 | 0 | _aComputed electron micrographs and defect identification. |
| 260 |
_aAmsterdamNew York, N.Y. : _bNorthHollandAmerican Elsevier, _c1973. |
||
| 300 | _a400 p. | ||
| 490 | 1 | _aSeries defects in crystalline solids, v. <7> | |
| 700 | 1 | _aHumble, P. | |
| 700 | 1 | _aClarebrough, L. M. | |
| 700 | 1 | _aMorton, A. J. | |
| 700 | 1 | _aForwood, C. T. | |
| 830 | _aSeries defects in crystalline solids, v. <7> | ||
| 999 |
_c22880 _d22880 |
||