| 000 | 00503nam a2200157 a 4500 | ||
|---|---|---|---|
| 008 | 170703t1975#### ||||f#|||||00| 0#uuu#d | ||
| 003 | AR-SmCIES | ||
| 091 | _a618 PMM | ||
| 100 | 1 |
_aSiegel, Benjamin M. _eed. |
|
| 245 | 1 | 0 | _aPhysical aspects of electron microscopy and microbeam analysis. |
| 260 |
_a[s.l.] : _b[s.n.], _cc1975. |
||
| 300 | _a474 p. | ||
| 700 | 1 | _aBeaman, Donald R. | |
| 999 |
_c22297 _d22297 |
||