000 00704nam a2200217 a 4500
008 170703s1967#### uk||||f#|||||00| 0#eng#d
003 AR-SmCIES
041 7 _aen
_2ISO 639-1
080 _a539.2
091 _a8522
100 1 _aAuleytner, Julian
245 1 0 _aX-ray methods in the study of defects in single crystals.
260 _aOxfordPolish scientific publ. :
_bPergamon pressWarszawa,
_c1967.
300 _a264 p.
500 _aBibliografia: p. 255-259
580 _aT+tulo original: Rentgenowskie metody badania mozaiki i dyslokacji
650 4 _aESTADO SOLIDO
650 4 _aDIFRACCION DE RAYOS X
999 _c22288
_d22288