| 000 | 00784nam a2200241 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1963####nyu||||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 080 | _a548.73 | ||
| 091 | _a16981 | ||
| 100 | 1 | _aGuinier, Andre Jean | |
| 245 | 1 | 0 | _aX ray studies of materials. |
| 260 |
_aNew York : _bWiley Interscience, _c1963. |
||
| 300 | _a156 p. | ||
| 490 | 1 | _aInterscience tracts on physics and astronomy ; no. 20 | |
| 500 | _aBibliografía al final de cada capítulo | ||
| 650 | 4 | _aDIFRACCION DE RAYOS X | |
| 650 | 4 | _aANALISIS ESPECTROQUIMICO | |
| 700 | 1 | _aDexter, David Lawrence | |
| 830 | _aInterscience tracts on physics and astronomy ; no. 20 | ||
| 999 |
_c22038 _d22038 |
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