| 000 | 00703nam a2200193 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1971####xxu||||f#|||||10| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 080 | _a621.385.833.28 | ||
| 091 | _a622 PMM | ||
| 111 | 2 |
_aSymposium on scanning electron microscope _n4 _cChicago,US _d1971 |
|
| 245 | 1 | 0 | _aPart I: fourth annual SEM symposium and Part II: Workshop on forensic applications of the SEM... |
| 773 | 1 | _aProceeedings... | |
| 260 |
_aChicago : _bIIT Research institute, _c1971. |
||
| 300 | _a618 p. | ||
| 650 | 4 | _aMICROSCOPIOS ELECTRONICOS DE BARRIDO | |
| 999 |
_c22004 _d22004 |
||