000 00693nam a2200193 a 4500
008 170703s1959####nyua|||f#|||||10| 0#eng#d
003 AR-SmCIES
041 7 _aen
_2ISO 639-1
080 _a539.23
091 _a18520
111 2 _aInternational conference on structure and properties of thin films
_cBolton Landing, NY,US
_d1959
245 1 0 _aStructure and properties of thin films [Proceedings].
260 _aNew York :
_bJ. Wiley and sons,
_c1959.
300 _a561 p. :
_bil.
500 _aBibliografĂ­a al final de cada artĂ­culo
650 4 _aPELICULAS DELGADAS [FISICA] -CONGRESOS
999 _c21924
_d21924