000 00984nam a2200301 a 4500
999 _c21879
_d21879
003 AR-SmCIES
005 20240205151925.0
008 170703s1960 o dne f r e e1 eng
040 _cAR-SmCIES
041 7 _aen
_2ISO 639-1
091 _a17889
111 _a2nd International Symposium X-Ray Microscopy and X-Ray Microanalysis
_cstockholm, England
_djan, 1960
_96733
245 1 0 _aX-ray microscopy and X-ray microanalysis
260 _aAmsterdam:
_bElsevier,
_c1960.
300 _ax, 542 p.:
_bgraf., fot.;
650 4 _aRAYOS X-CONGRESOS
_96734
650 7 _aMICRORADIOGRAPHY
_2INIST
_96735
650 7 _aMICROSCOP� A
_2INIST
_92971
650 7 _aX-RAY EMISSION SPECTROSCOPY
_2INIST
_96736
650 7 _aX-RAY DIFFRACTION
_2INIST
_92904
650 7 _aABSORPTION SPECTROSCOPY
_2INIST
_92885
700 _aEngstrôm, A.
_eEd.
_96737
700 _aCosslett, V.
_eEd.
_96738
700 _aPattee, h.
_eEd.
_96739
942 _2udc
_cBK