| 000 | 00655nam a2200217 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1960#### ukad||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 080 | _a548.73 | ||
| 091 | _a12495 | ||
| 100 | 1 | _aCosslett, Vernon Ellis | |
| 245 | 1 | 0 | _aX ray microscopy. |
| 260 |
_aCambridge : _bThe University press, _c1960. |
||
| 300 |
_axiv, 406 p. : _bil., lám., diagr. ; 22,5 cm |
||
| 500 | _aApendice y bibliografia: p. 372-402 | ||
| 650 | 4 | _aDIFRACCION DE RAYOS X | |
| 650 | 4 | _aMICROSCOPIOS | |
| 700 | 1 |
_aNixon, W. C. _ecolab |
|
| 999 |
_c21741 _d21741 |
||