| 000 | 00689nam a2200217 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1969####nyu||||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a349 PMM | ||
| 092 | _aV.2 | ||
| 100 | 1 |
_aMurt, E. M. _eed |
|
| 245 | 1 | 0 | _aPhysical measurements and analysis of thin films: Progress in analytical chemistry. |
| 260 |
_aNew York : _bPlenum Press, _c1969. |
||
| 490 | 1 | _aPROGRESS in analytical chemistry | |
| 700 | 1 |
_aGuldner, W. G. _eed |
|
| 800 | 1 |
_aSimmons, I. L. _eed |
|
| 800 | 1 |
_aLublin, P. _eed |
|
| 830 | _aPROGRESS in analytical chemistry | ||
| 999 |
_c21437 _d21437 |
||