| 000 | 01014nam a2200289 a 4500 | ||
|---|---|---|---|
| 999 |
_c21170 _d21170 |
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| 003 | AR-SmCIES | ||
| 005 | 20241114141823.0 | ||
| 008 | 170703s1991####nyua|||f#|||||00| 0#eng#d | ||
| 020 | _a0306438240 | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a1868 PMTM | ||
| 100 | 1 |
_aHeinrich, Kurt F. J. _eed. _99520 |
|
| 245 | 1 | 0 | _aElectron probe quantitation |
| 260 |
_aNew York: _aLondon: _bPlenum Press, _c1991 |
||
| 300 |
_aviii, 400 p. : _bilustraciones; gráficos; tablas; |
||
| 500 | _a"The present volume, is the result of a gathering of international experts, in 1988, at NBS, now the National Institute of Standards and Technology, NIST" | ||
| 500 | _aBibliografía al final de cada artículo | ||
| 650 | 4 |
_aQU� MICA _2INIST _9263 |
|
| 650 | 4 |
_aQU� MICA ANAL� TICA _2SPINEST _9234 |
|
| 650 | 4 |
_aSONDAS _2INIST _99496 |
|
| 650 | 4 |
_aELECTRÓNICA _95919 _2SPINEST |
|
| 650 | 4 |
_aRAYOS X _2SPINEST _94536 |
|
| 700 | 1 |
_aNewbury, Dale E. _eed. _93651 |
|
| 942 |
_2udc _cBK |
||