| 000 | 01131nam a2200229 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1966####enka|||f#|||||10| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a17379 | ||
| 100 | 1 |
_aAnderson, Joseph Chapman _eed. |
|
| 245 | 1 | 4 | _aThe use of thin films in physical investigations. |
| 260 |
_aLondon and New York : _bAcademic Press, _c1966. |
||
| 300 |
_axix, 462 p. : _bil. ; 23,5 cm. |
||
| 500 | _aA NATO advanced study institute held at the Imperial College of Science and Technology, University of London, 19-24 July 1965 | ||
| 500 | _aBibliografía al final de cada artículo | ||
| 650 | 4 | _aPELICULAS DELGADAS [FISICA] -CURSOS | |
| 711 | 2 |
_aNATO advanced study institute on the use of thin films in physical investigations _cLondres,GB _d1965 |
|
| 999 |
_c20738 _d20738 |
||