000 00444nam a2200169 a 4500
008 170703s1958####nyu||||f#|||||00| 0#eng#d
003 AR-SmCIES
041 7 _aen
_2ISO 639-1
091 _a8132
100 1 _aJury, E.I.
245 1 0 _aSampled-data control systems.
260 _aNew York :
_bJohn Wiley,
_c1958.
300 _a453 p.
500 _aEra de CC
999 _c20637
_d20637